US 12,112,818 B2
Scan chain compression for testing memory of a system on a chip
Harold Pilo, Underhill, VT (US); and Shishir Kumar, Uttar Pradesh (IN)
Assigned to Synopsys, Inc., Sunnyvale, CA (US)
Filed by Synopsys, Inc., Mountain View, CA (US)
Filed on Jul. 1, 2022, as Appl. No. 17/856,744.
Claims priority of application No. 202141030110 (IN), filed on Jul. 5, 2021.
Prior Publication US 2023/0005562 A1, Jan. 5, 2023
Int. Cl. G11C 7/00 (2006.01); G11C 29/30 (2006.01); G11C 29/40 (2006.01); G11C 29/32 (2006.01)
CPC G11C 29/40 (2013.01) [G11C 29/30 (2013.01); G11C 2029/3202 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method of using on-chip circuitry to test a memory of a chip, the method comprising:
in a capture stage, receiving, at a first n-bit compression structure including n first stage latches corresponding to each bit of the first n-bit compression structure, a value at each respective first stage latch for each of n memory addresses of the memory of the chip, such that each respective first stage latch receives a respective value from a memory address of the memory, n being an integer greater than one;
in the capture stage, passing the values from each respective first stage latch through compression logic of the first n-bit compression structure to output a single compressed address value, and providing the single compressed address value to a second stage latch of the first n-bit compression structure; and
in a testing stage, comparing the single compressed address value of the second stage latch of the first n-bit compression structure, as output from the first n-bit compression structure, to a desired value to determine whether an interface to the memory is operating as desired.