CPC G11C 16/3431 (2013.01) [G06N 3/045 (2023.01); G11C 16/28 (2013.01)] | 17 Claims |
1. A device comprising:
a threshold voltage distribution estimation network configured to generate an estimated distribution matrix using a feature distribution matrix and read trial information, the threshold voltage distribution estimation network including a feature distribution generating circuit and a combination circuit, the feature distribution generating circuit configured to generate the feature distribution matrix from a plurality of threshold voltage distributions for a plurality of pages of a memory device, the combination circuit configured to generate the estimation distribution matrix by combining a plurality of vectors included in the feature distribution matrix using a combination coefficient vector; and
a read reference voltage estimation network configured to generate a read reference voltage from the estimated distribution matrix,
wherein the read trial information includes a read trial vector and an output value, the output value being generated by applying the read trial vector to a threshold voltage distribution for a page to be read among the plurality of threshold voltage distributions, and
wherein the threshold voltage distribution estimation network further includes a coefficient estimation network configured to generate the combination coefficient vector from the read trial information.
|