US 12,112,666 B2
Display device
Hae-Yeon Lee, Yongin-si (KR); Sukyoung Kim, Yongin-si (KR); Hwayoung Song, Yongin-si (KR); Kwangsae Lee, Yongin-si (KR); and Il-Joo Kim, Yongin-si (KR)
Assigned to SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do (KR)
Filed by Samsung Display Co., LTD., Yongin-si (KR)
Filed on Jul. 31, 2023, as Appl. No. 18/228,244.
Claims priority of application No. 10-2022-0165896 (KR), filed on Dec. 1, 2022.
Prior Publication US 2024/0185750 A1, Jun. 6, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G09G 3/00 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01); H10K 59/131 (2023.01); H10K 59/40 (2023.01); H10K 102/00 (2023.01)
CPC G09G 3/006 (2013.01) [G06F 3/0412 (2013.01); G06F 3/0443 (2019.05); G09G 3/035 (2020.08); H10K 59/131 (2023.02); H10K 59/40 (2023.02); G06F 2203/04102 (2013.01); G06F 2203/04111 (2013.01); G09G 2300/0408 (2013.01); G09G 2300/0426 (2013.01); G09G 2330/12 (2013.01); G09G 2354/00 (2013.01); H10K 2102/311 (2023.02)] 20 Claims
OG exemplary drawing
 
1. A display device comprising:
a substrate comprising a display area on which a plurality of pixels are disposed, a peripheral area surrounding the display area, a hole area positioned inside the display area, a pad area, and a bending area positioned between the peripheral area and the pad area in a plan view;
a crack detection line comprising a first part disposed on the substrate in the pad area and extending to the bending area and the peripheral area and a second part connected to the first part, disposed to surround the hole area, and extending to the peripheral area, the bending area and the pad area;
a printed circuit board disposed on the substrate in the pad area;
a plurality of first transistors disposed on the substrate in the pad area and connected in series between the printed circuit board and the first part of the crack detection line, wherein each of gate electrodes of the first transistors is connected to a first signal line to receive a first signal; and
a plurality of second transistors disposed on the substrate in the pad area and connected in series between a constant voltage line for applying a constant voltage and the first part of the crack detection line, wherein each of gate electrodes of the second transistors is connected to a second signal line to receive a second signal.