US 12,111,643 B2
Inspection system, terminal device, inspection method, and non-transitory computer readable storage medium
Ryo Masumura, Kitakyushu (JP); and Masaru Adachi, Kitakyushu (JP)
Assigned to KABUSHIKI KAISHA YASKAWA DENKI, Kitakyushu (JP)
Filed by KABUSHIKI KAISHA YASKAWA DENKI, Kitakyushu (JP)
Filed on Aug. 23, 2021, as Appl. No. 17/408,487.
Application 17/408,487 is a continuation of application No. PCT/JP2019/008172, filed on Mar. 1, 2019.
Prior Publication US 2021/0382467 A1, Dec. 9, 2021
Int. Cl. G05B 19/418 (2006.01); G06N 20/00 (2019.01)
CPC G05B 19/41875 (2013.01) [G06N 20/00 (2019.01); G05B 2219/32368 (2013.01)] 18 Claims
OG exemplary drawing
 
1. An inspection system comprising:
machine learning circuitry configured to determine whether each of objects belongs to a non-defective item attribute based on feature data of each of the objects;
feature data acquisition circuitry configured to acquire feature data of reevaluated non-defective objects which are determined to belong to the non-defective item attribute without using the machine learning circuitry among excluded objects which have been determined not to belong to the non-defective item attribute by the machine learning circuitry; and
parameter update circuitry configured to update a learning parameter of the machine learning circuitry based on teaching data including the acquired feature data acquired by the feature data acquisition circuitry.