| CPC G01R 31/2884 (2013.01) | 6 Claims |
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1. A mixed signal test device based on graphical control, wherein the device uses a Tester-On-board architecture to extend a power generation and measurement unit, an analog waveform generation and collection unit, and an analog waveform control unit on a digital waveform pattern generation and measurement board; the digital waveform pattern generation and measurement board comprises a system bus, a board power supply unit, a digital control and collection unit, a logic control unit, a logic waveform data storage unit, and an analog waveform data storage unit, wherein
the board power supply unit is configured to supply power to the logic control unit, the analog waveform control unit and the power generation and measurement unit;
the logic control unit is connected to the power generation and measurement unit, the digital control and collection unit, and the logic waveform data storage unit respectively; the logic control unit is further connected to the analog waveform control unit through the system bus; the analog waveform control unit is connected to the analog waveform generation and collection unit, and the analog waveform data storage unit respectively;
the logic control unit is configured to perform generation and measurement of a digital waveform pattern of a System on Chip (SOC) to be tested to achieve generation and collection of the digital waveform, is configured to control the analog waveform control unit to achieve generation and collection control of an analog waveform of the SOC to be tested, and is configured to control the power generation and measurement unit to achieve generation and collection control of power of the SOC to be tested, so that the generation and measurement of the digital waveform pattern of the SOC to be tested, the generation and collection control of the analog waveform of the SOC to be tested, and the generation and collection control of the power of the SOC to be tested, are executed in parallel.
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