CPC G01N 21/0303 (2013.01) [B01L 3/502715 (2013.01); B01L 3/5085 (2013.01); B01L 9/523 (2013.01); G01N 1/30 (2013.01); G01N 15/1012 (2013.01); G01N 21/05 (2013.01); G01N 21/17 (2013.01); G01N 21/27 (2013.01); G01N 21/6428 (2013.01); G01N 21/645 (2013.01); G01N 21/6458 (2013.01); G01N 21/6486 (2013.01); G01N 33/487 (2013.01); G01N 33/49 (2013.01); G01N 33/5005 (2013.01); G01N 33/56966 (2013.01); G01N 33/56972 (2013.01); G02B 7/09 (2013.01); G02B 21/00 (2013.01); G02B 21/0076 (2013.01); G02B 21/088 (2013.01); G02B 21/125 (2013.01); G02B 21/16 (2013.01); G02B 21/244 (2013.01); G02B 21/34 (2013.01); G02B 21/365 (2013.01); G02B 21/367 (2013.01); B01L 2300/0654 (2013.01); B01L 2300/168 (2013.01); G01N 15/01 (2024.01); G01N 2015/1014 (2024.01); G01N 2015/1486 (2013.01); G01N 2021/1738 (2013.01); G01N 2021/6439 (2013.01); G01N 2201/061 (2013.01); G01N 2201/068 (2013.01); G01N 2201/12 (2013.01); G01N 2333/70589 (2013.01); G01N 2333/70596 (2013.01)] | 12 Claims |
1. A system for analyzing a sample, the system comprising:
a dark field illumination source;
another illumination source;
a detector;
an objective lens with an aperture;
a sample holder comprising a cover, a base having a first side and a second side, a first elongate sample chamber, and a second elongate sample chamber wherein the illumination source and the detector are both located on the same side of the sample holder and wherein said another illumination source is located on another size of the sample holder, wherein the dark field illumination source is positioned so that light from the dark field illumination source to the sample holder is directed only at an oblique angle with respect to the base,
wherein the first elongate sample chamber has a first sample inlet and a first vent;
wherein the second elongate sample chamber has a second sample inlet and a second vent.
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