US 12,111,207 B2
Despeckling in optical measurement systems
Matthew A Terrel, Campbell, CA (US); David S Gere, Palo Alto, CA (US); Alexander F Sugarbaker, Woodside, CA (US); Thomas C Greening, San Jose, CA (US); Jason S Pelc, Sunnyvale, CA (US); and Mark A. Arbore, Los Altos, CA (US)
Assigned to APPLE INC., Cupertino, CA (US)
Filed by Apple Inc., Cupertino, CA (US)
Filed on Aug. 16, 2023, as Appl. No. 18/234,794.
Claims priority of provisional application 63/409,538, filed on Sep. 23, 2022.
Claims priority of provisional application 63/461,777, filed on Apr. 25, 2023.
Prior Publication US 2024/0102856 A1, Mar. 28, 2024
Int. Cl. G01J 1/44 (2006.01)
CPC G01J 1/44 (2013.01) 26 Claims
OG exemplary drawing
 
1. An optical measurement system comprising:
a light generation assembly comprising a light source unit that is configured to generate light;
a photonic integrated circuit comprising a launch group, the launch group comprising a plurality of emitters optically coupled to the light generation assembly to receive light generated by the light generation assembly;
a detector group; and
a controller configured to perform a measurement using the light generation assembly, the launch group, and the detector group, wherein the measurement comprises:
generating light using the light source unit;
simultaneously emitting the generated light from each of the plurality of emitters such that the plurality of emitters emits light at a corresponding set of phase states defined by a measurement state;
changing, during the simultaneous emission of the generated light, the measurement state between a plurality of target measurement states having a common phase state distribution;
measuring, using the detector group, return light received during the simultaneous emission of the generated lighted light, wherein:
during the measurement, the plurality of emitters only emits light at measurement states having the common phase state distribution.