US 11,785,333 B2
Simulation-based capture system adjustments
Vijaykumar Nayak, San Diego, CA (US); and Nathan Reede Mazhar Godwin, San Diego, CA (US)
Assigned to Hewlett-Packard Development Company, L.P., Spring, TX (US)
Appl. No. 17/272,592
Filed by HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P., Spring, TX (US)
PCT Filed Jan. 8, 2019, PCT No. PCT/US2019/012650
§ 371(c)(1), (2) Date Mar. 1, 2021,
PCT Pub. No. WO2020/145945, PCT Pub. Date Jul. 16, 2020.
Prior Publication US 2021/0360148 A1, Nov. 18, 2021
Int. Cl. H04N 5/232 (2006.01); H04N 23/60 (2023.01); H04N 17/00 (2006.01); H04N 23/90 (2023.01); H04N 13/246 (2018.01); H04N 13/243 (2018.01)
CPC H04N 23/64 (2023.01) [H04N 17/002 (2013.01); H04N 23/90 (2023.01); H04N 13/243 (2018.05); H04N 13/246 (2018.05)] 17 Claims
OG exemplary drawing
 
1. A system comprising:
a processor; and
a memory storing instructions executable by the processor to:
receive a reference model of an object to be scanned;
simulate capture settings of a capture system comprising a number of capture devices placed around the object;
extract simulated capture data for each capture device in the capture system;
fuse the extracted simulated capture data for each capture device to generate fused data for the capture system;
compare the fused data against the reference model to generate first comparison results;
determine a quality metric for the capture system based on the first comparison results;
compare the quality metric against a quality threshold to generate second comparison results;
determine adjustments to the capture settings based on the second comparison results;
adjust the capture settings according to the determined adjustments; and
capture actual capture data of the object with the capture system using the adjusted capture settings.