| CPC H04N 25/51 (2023.01) [H04N 25/616 (2023.01); H04N 25/709 (2023.01); H04N 25/77 (2023.01); H04N 25/78 (2023.01)] | 20 Claims | 

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               1. A control method of a high gain image sensor, wherein 
            the high gain image sensor comprises a plurality of columns of pixel units arranged in an array, each column of pixel units has a column-common current input connecting line and a column-common current output connecting line, a gate of a source follower transistor of each pixel unit in each column is connected to a respective floating diffusion region, a drain of the source follower transistor of each pixel unit in each column is connected to the column-common current input connecting line, and a source of the source follower transistor of each pixel unit in each column is connected to the column-common current output connecting line directly or through respective row selection transistors; 
                the column-common current input connecting line and the column-common current output connecting line are connected to a column signal readout unit; 
                the column signal readout unit comprises a column bias current source and a column P-channel Metal-Oxide-Semiconductor (PMOS) amplifier transistor, wherein the column bias current source is connected to the column-common current output connecting line, a drain of the column PMOS amplifier transistor is connected to the column-common current input connecting line, and a gate of the column PMOS amplifier transistor is connected to the column-common current output connecting line directly or through a capacitor, to acquire an amplified signal of a floating diffusion region of a readout row pixel unit on the column-common current input connecting line. 
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