| CPC H01M 4/366 (2013.01) [H01M 4/48 (2013.01); H01M 4/587 (2013.01); H01M 10/0587 (2013.01); H01M 50/103 (2021.01); H01M 2004/021 (2013.01); H01M 2004/027 (2013.01); H01M 2220/20 (2013.01)] | 15 Claims |

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1. A negative electrode plate, comprising:
a negative electrode current collector, having a first surface and a second surface opposite each other in a thickness direction of the negative electrode current collector;
a first negative electrode film layer located on the first surface side, wherein the first negative electrode film layer comprises first silicon-based negative electrode active material particles, and a grain size d1 of a crystal grain contained in the first silicon-based negative electrode active material particle and a median particle size by volume Dv150 of the first silicon-based negative electrode active material particles satisfy: 0.0003≤d1/Dv150≤0.004; and
a second negative electrode film layer located on the second surface side, wherein the second negative electrode film layer comprises second silicon-based negative electrode active material particles, and a grain size d2 of a crystal grain contained in the second silicon-based negative electrode active material particles and a median particle size by volume Dv250 of the second silicon-based negative electrode active material particles satisfy:
0.0002≤d2/Dv250≤0.002;
wherein
a capacity C1 per unit area of the first negative electrode film layer and a capacity C2 per unit area of the second negative electrode film layer satisfy: 0.005 mAh/(g·mm2)≤C2<C1≤0.2 mAh/(g·mm2).
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