| CPC H01L 23/53204 (2013.01) [H01L 23/3107 (2013.01)] | 8 Claims |

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1. A semiconductor package comprising:
a conductive material disposed in electrical contact with a semiconductor die;
a protective mold structure disposed on the semiconductor die; and
a dielectric layer disposed on the semiconductor die and between the protective mold structure and the conductive material,
wherein the dielectric layer is disposed on a top portion of the semiconductor die and on a stepped structure including a first step etched in a side portion of the semiconductor die, and
wherein the dielectric layer is disposed between the protective mold structure and the stepped structure of the side portion of the semiconductor die.
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