| CPC H01L 21/0262 (2013.01) [C23C 16/0227 (2013.01); C23C 16/08 (2013.01); C23C 16/50 (2013.01); C23C 16/56 (2013.01); C30B 25/105 (2013.01); C30B 25/14 (2013.01); C30B 25/186 (2013.01); C30B 29/52 (2013.01); H01J 37/05 (2013.01); H01J 37/3244 (2013.01); H01L 21/02532 (2013.01); H01L 21/02661 (2013.01); H01L 21/28088 (2013.01); H01L 21/3065 (2013.01); H10D 30/024 (2025.01); H10D 30/43 (2025.01); H10D 30/6211 (2025.01); H10D 30/6713 (2025.01); H10D 30/6735 (2025.01); H10D 30/6757 (2025.01); H10D 30/701 (2025.01); H10D 30/797 (2025.01); H10D 62/021 (2025.01); H10D 62/118 (2025.01); H10D 62/121 (2025.01); H10D 62/151 (2025.01); H10D 62/822 (2025.01); H10D 64/017 (2025.01); H10D 84/017 (2025.01); H10D 84/0177 (2025.01); H10D 84/0184 (2025.01); H10D 84/0186 (2025.01); H10D 84/0193 (2025.01); H10D 84/038 (2025.01); H10D 84/853 (2025.01); H01J 2237/3321 (2013.01)] | 20 Claims |

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1. A method comprising:
flowing first precursors over a semiconductor substrate to form an epitaxial region, the epitaxial region comprising a first element and a second element;
converting a second precursor into first radicals and first ions;
separating the first radicals from the first ions;
flowing the first radicals over the epitaxial region to remove at least some of the second element from the epitaxial region; and
after flowing the first radicals, flowing third precursors over the epitaxial region.
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