| CPC H01J 37/32183 (2013.01) [H01J 37/32091 (2013.01); H01J 37/32642 (2013.01); H01J 37/32724 (2013.01); H01L 21/67069 (2013.01); H01L 21/6833 (2013.01); H03H 7/0115 (2013.01); H03H 7/38 (2013.01); H01J 2237/002 (2013.01); H01J 2237/3347 (2013.01)] | 14 Claims |

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1. Plasma processing equipment comprising:
a chuck stage having an upper surface dedicated to support a substrate thereon;
a lower electrode disposed under the chuck stage;
an upper electrode disposed over the chuck stage;
an AC power supply configured to produce a first signal, a second signal and a third signal of respective frequencies different from each other and operatively connected to the upper electrode or the lower electrode;
a dielectric ring extending around the chuck stage;
an edge electrode located inside the dielectric ring;
a resonance circuit connected to the edge electrode and configured to selectively allow only the third signal among the first, second and third signals to pass;
a cooling thermal pad on an upper surface of the dielectric ring;
a first cooling channel on an upper surface of the cooling thermal pad with a first inlet and a first outlet and containing a first refrigerant; and
a second cooling channel on the upper surface of the cooling thermal pad with a second inlet and a second outlet and containing a second refrigerant,
wherein the first and second cooling channels are thermally coupled to the upper surface of the dielectric ring and the edge electrode, and
wherein the first cooling channel and the second cooling channel are configured to independently circulate the first refrigerant and the second refrigerant, respectively.
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