| CPC H01J 1/34 (2013.01) [H01J 9/12 (2013.01); H01J 2201/3423 (2013.01)] | 18 Claims |

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1. A photocathode epitaxial structure comprising:
an improved substrate stack, the improved substrate stack comprising:
a GaAs substrate; and
one or more additional layers formed on the GaAs substrate, the one or more additional layers configured to provide an improved substrate stack surface with predetermined characteristics for forming a semiconductor device on the improved substrate stack surface; and
an InGaAs p-type photocathode formed on the improved substrate stack surface, the InGaAs p-type photocathode having a predetermined percentage of In,
wherein the improved substrate comprises an overshoot layer having a first amount of Indium doping that is greater than second amount of doping in the InGaAs p-type photocathode to reduce strain.
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