US 12,437,724 B2
Scan driver
Haijung In, Yongin-si (KR); Dongeup Lee, Yongin-si (KR); and Jaesic Lee, Yongin-si (KR)
Assigned to Samsung Display Co., Ltd., Yongin-si (KR)
Filed by Samsung Display Co., Ltd., Yongin-Si (KR)
Filed on Apr. 16, 2024, as Appl. No. 18/636,266.
Application 18/636,266 is a continuation of application No. 18/134,545, filed on Apr. 13, 2023, granted, now 11,972,736.
Claims priority of application No. 10-2022-0061652 (KR), filed on May 19, 2022.
Prior Publication US 2024/0274089 A1, Aug. 15, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G09G 3/3266 (2016.01); G09G 3/3233 (2016.01)
CPC G09G 3/3266 (2013.01) [G09G 3/3233 (2013.01); G09G 2300/0819 (2013.01); G09G 2300/0842 (2013.01); G09G 2310/0286 (2013.01); G09G 2330/021 (2013.01)] 30 Claims
OG exemplary drawing
 
1. A scan driver comprising a plurality of stages, wherein each of the plurality of stages includes:
a first transistor connected between an input terminal to which a start signal is applied and a first node;
a second transistor connected between the input terminal and the first node;
a third transistor connected between a first voltage input terminal to which a first voltage is applied and a second node, a gate of the third transistor connected to the first node;
a fourth transistor connected between the second node and a second voltage input terminal to which a second voltage is applied, a first gate of the fourth transistor connected to the first node;
a pull-up transistor connected between the first voltage input terminal and an output terminal, a gate of the pull-up transistor connected to the second node; and
a pull-down transistor connected between the output terminal and the second voltage input terminal, a first gate of the pull-down transistor connected to the second node,
wherein a transistor type of the third transistor and a transistor type of the fourth transistor are different each other.