US 12,437,397 B2
Imaging system and method for radiographic inspection
Zhiqiang Chen, Beijing (CN); Li Zhang, Beijing (CN); Xin Jin, Beijing (CN); Hongkai Yang, Beijing (CN); Xiaofei Xu, Beijing (CN); Zhenhua Zhao, Beijing (CN); Siyuan Zhang, Beijing (CN); and Changyu Chen, Beijing (CN)
Assigned to TSINGHUA UNIVERSITY, Beijing (CN); and Nuctech Company Limited, Beijing (CN)
Filed by TSINGHUA UNIVERSITY, Beijing (CN); and Nuctech Company Limited, Beijing (CN)
Filed on Oct. 17, 2022, as Appl. No. 17/967,039.
Claims priority of application No. 202111204463.6 (CN), filed on Oct. 15, 2021.
Prior Publication US 2023/0124325 A1, Apr. 20, 2023
Int. Cl. G06T 7/00 (2017.01); A61B 6/00 (2006.01); A61B 6/02 (2006.01); A61B 6/03 (2006.01); G06V 10/25 (2022.01)
CPC G06T 7/0012 (2013.01) [A61B 6/027 (2013.01); A61B 6/032 (2013.01); A61B 6/54 (2013.01); G06V 10/25 (2022.01); G06T 2207/10081 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An imaging system for radiographic inspection, comprising:
an inspection area, wherein an object under inspection can enter the inspection area, the inspection area comprises an imaging area, wherein the imaging area is a local area of the inspection area, a region of interest of the object under inspection can enter the imaging area, the region of interest is a local region of the object under inspection, and the imaging area is configured to be sufficient to accommodate the region of interest of the object under inspection;
a first ray source assembly for emitting X-rays, wherein the first ray source assembly comprises a plurality of distributed ray sources, each distributed ray source comprises a plurality of first targets, and all the first targets of the first ray source assembly are arranged in a first ray source plane;
a first detector assembly for receiving X-rays emitted from the first ray source assembly and transmitting through the imaging area of the imaging system, wherein the first detector assembly comprises a plurality of first detector units, each first detector unit comprises a plurality of first detector crystals, the plurality of first detector units are arranged in a detector plane, and the detector plane and the first ray source plane are spaced apart from each other in a travelling direction of the object under inspection with a predetermined distance; and
a ray source control device, configured such that when the region of interest is at least partially located in the imaging area, the first ray source assembly emits X-rays simultaneously from at least two first targets to the imaging area at the same time,
wherein among the at least two first targets of the first ray source assembly that simultaneously emit X-rays to the imaging area, a ray emission range of each first target is configured to cover merely the imaging area and be insufficient to cover the inspection area, and the first detector crystals corresponding to the ray emission ranges of any two first targets do not coincide with each other, and
the first ray source assembly further comprises at least one second target, and a ray emission range of the at least one second target is configured to be larger than the ray emission range of each first target and be able to cover the entire inspection area.