| CPC G06F 1/1658 (2013.01) | 6 Claims |

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1. A system for a memory module mounting test with a test tray arrangement function, the system comprising:
a test tray on which a memory module array in which a plurality of memory modules are positioned in a predetermined pattern is loaded;
a tester in which the test tray is able to be seated and a socket corresponding to the predetermined pattern is formed to perform a test on the memory module array;
a transfer for transferring the test tray from an initial position to a seating position where the test tray is seated in the tester; and
a mounter for mounting the memory module array transferred to the seating position in the socket,
wherein the transfer comprises:
a support portion supporting the test tray positioned at the initial position;
a first driving portion transferring the support portion from the initial position to the seating position;
a second driving portion rotating the support portion;
an angle adjustment sensor for understanding an adjustment angle at which the support portion needs to be rotated to arrange the memory module array with the socket; and
a control portion for controlling the first driving portion and the second driving portion so that the support portion is transferred to the seating position and rotated in response to the adjustment angle,
wherein the angle adjustment sensor understands the adjustment angle by recognizing two setting areas positioned adjacent to the socket, and the two setting areas guide a disposition state of the socket, and
wherein:
the two setting areas are more protruded or recessed than adjacent areas; and
the angle adjustment sensor measures a distance by scanning a first area including one of the two setting areas and a second area including the other of the two setting areas, respectively, and recognizes two areas having a critical distance difference from surroundings in the first area and the second area as the two setting areas.
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