US 12,436,335 B2
Calibration system for wavelength-division multiplexing, wavelength-division multiplexing system, and calibrating method for wavelength-division multiplexing
Tai-Chun Huang, New Taipei (TW); Lan-Chou Cho, Hsinchu (TW); Chewn-Pu Jou, Hsinchu (TW); and Stefan Rusu, Sunnyvale, CA (US)
Assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD., Hsinchu (TW)
Filed by TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD., Hsinchu (TW)
Filed on Oct. 22, 2023, as Appl. No. 18/491,789.
Application 18/491,789 is a continuation of application No. 17/843,940, filed on Jun. 17, 2022, granted, now 11,835,760.
Prior Publication US 2024/0053539 A1, Feb. 15, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G02B 6/12 (2006.01)
CPC G02B 6/12026 (2013.01) [G02B 6/12016 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A wavelength-division multiplexing (WDM) system, comprising:
a WDM demultiplexer with a plurality of channels;
a plurality of heating devices coupled to the plurality of channels, each of the plurality of heating devices corresponds to one of the plurality of channels respectively;
a plurality of optical sensors coupled to the plurality of channels, each of the plurality of optical sensors corresponds to one of the plurality of channels respectively; and
a first thermal sensor configured to sense a first temperature of a first channel of the plurality of the channels,
wherein a first optical sensor of the plurality of optical sensors is coupled to the first channel, the first optical sensor is configured to convert a first optical signal into a first electrical signal,
wherein a first heating device of the plurality of heating devices is configured to either adjust or maintain the first temperature of the first channel based on the first electrical signal.