| CPC G01R 31/52 (2020.01) [G01R 31/2601 (2013.01); G01R 31/2619 (2013.01)] | 8 Claims |

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1. A method for testing and evaluating a short-circuit withstand capability of a press-pack power component, wherein the method comprises the following steps:
S1: building a test platform suitable for a short-circuit withstand capability of a press-pack power component;
S2: obtaining a voltage level, a pressure load, an environment temperature, and a maximum junction temperature fluctuation range of a to-be-tested press-pack power component in an actual working condition;
S3: customizing a test scheme of the short-circuit withstand capability, which comprises: separately testing short-circuit withstand capabilities of the to-be-tested press-pack power component at different voltage, pressure, and temperature levels; monitoring, in real time, changes of a component short-circuit current IS, a collector-emitter voltage VCE, and a grid-emitter voltage VGE until the to-be-tested press-pack power component fails due to short circuit; and correspondingly obtaining a relationship between a voltage and each of a short-circuit critical energy ECR and a critical temperature TCR, a relationship between a pressure and a short-circuit current, and a relationship between a temperature and a short-circuit current; and
S4: obtaining, according to test results obtained under different voltages, pressures, and temperatures, a relationship between a short-circuit withstand capability of the to-be-tested press-pack power component and each of a voltage, a pressure, and a temperature.
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