US 12,436,184 B2
Test board including test executable integrated circuit for testing a device under test, and diagnostic system, diagnostic method, and non-transitory computer-readable storage medium storing diagnostic program of the test board
Tetsuharu Kojima, Tokyo (JP)
Assigned to Kioxia Corporation, Tokyo (JP)
Filed by Kioxia Corporation, Tokyo (JP)
Filed on Jun. 8, 2023, as Appl. No. 18/331,596.
Claims priority of application No. 2022-139236 (JP), filed on Sep. 1, 2022.
Prior Publication US 2024/0077530 A1, Mar. 7, 2024
Int. Cl. G01R 31/28 (2006.01); G01R 1/04 (2006.01)
CPC G01R 31/2868 (2013.01) [G01R 1/0458 (2013.01); G01R 31/2879 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A test board on which a test executable integrated circuit is mounted, the test executable integrated circuit being configured to execute a test of a device under test, and the test board comprising:
a first input/output terminal for connecting a first measuring apparatus capable of supplying electric power to the test board and controlling the test executable integrated circuit;
a second input/output terminal for connecting a second measuring apparatus capable of measuring electrical characteristics of the test executable integrated circuit; and
a contact unit mounted on the test board through the second input/output terminal and configured to electrically connect the second measuring apparatus.