US 12,436,120 B2
Sample container and measuring method
Genki Kinugasa, Tokyo (JP); and Kotaro Asami, Tokyo (JP)
Assigned to JEOL Ltd., Tokyo (JP)
Filed by JEOL Ltd., Tokyo (JP)
Filed on Jun. 19, 2023, as Appl. No. 18/211,372.
Claims priority of application No. 2022-098822 (JP), filed on Jun. 20, 2022.
Prior Publication US 2023/0408427 A1, Dec. 21, 2023
Int. Cl. G01N 23/2204 (2018.01); G01N 23/223 (2006.01)
CPC G01N 23/2204 (2013.01) [G01N 23/223 (2013.01)] 15 Claims
OG exemplary drawing
 
1. An X-ray fluorescence analyzer, comprising:
a sample chamber maintained in a vacuum atmosphere; and
a sample container placed in the sample chamber;
wherein the sample container comprises:
a sealable first receptacle having a pressure therein;
a pressure adjusting valve for adjusting the pressure in the first receptacle;
a second receptacle for receiving a liquid sample and having both a first opening and a second opening located inside and outside, respectively, of the first receptacle; and
an analytical film closing off the second opening and transmitting X-rays,
wherein measurement is performed in the sample chamber maintained in the vacuum atmosphere by irradiating the liquid sample contained in the sample container with X-rays.