| CPC G01N 23/203 (2013.01) [G01N 23/20008 (2013.01); G01N 23/205 (2013.01); G01N 23/2055 (2013.01); G01L 1/25 (2013.01); G01L 5/0047 (2013.01); G01N 2223/053 (2013.01); G01N 2223/0566 (2013.01); G01N 2223/306 (2013.01); G01N 2223/607 (2013.01)] | 11 Claims |
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1. A measurement system enabling measurement of an intensity distribution of diffracted X-rays obtained by irradiating a fillet portion of a metallic structure with X-rays, the metallic structure comprising: an axis portion; and a flange portion protruding radially from the axis portion, wherein the metallic structure comprises the fillet portion in a connection portion between the axis portion and the flange portion, the measurement system comprising:
a diffracted X-rays measurement device provided with an irradiation unit that irradiates the fillet portion with X-rays; and
a positioning device that positions the diffracted X-rays measurement device with respect to the fillet portion,
wherein
the positioning device comprises:
a moving mechanism that moves three-dimensionally the diffracted X-rays measurement device relative to the fillet portion; and
a rotation mechanism that rotates the diffracted X-rays measurement device in such a direction that an angle of incidence of the X-rays with respect to the fillet portion is changed,
wherein a control unit controls movement by the moving mechanism and rotation by the rotation mechanism such that the diffracted X-rays measurement device does not come into contact with the axis portion and the flange portion,
wherein the control unit controls the movement by the moving mechanism and the rotation by the rotation mechanism within such a range that the diffracted X-rays measurement device can detect a peak of diffracted X-rays,
wherein, in a case in which: an axis passing through a fillet center and being parallel to a central axis of the axis portion is represented by an X-axis; an axis passing through the fillet center and being parallel to a protrusion direction of the flange portion is represented by a Z-axis: a coordinate of the fillet center is represented by (0, 0); a coordinate of a rotation center of the diffracted X-rays measurement device is represented by (X, Z); an irradiation distance of the X-rays by the diffracted X-rays measurement device is denoted by L [mm]; a minimum value of the irradiation distance of the X-rays is denoted by Lmin [mm]; a maximum value of the irradiation distance of the X-rays is denoted by Lmax [mm]; a fillet angle is denoted by θ [°]; a fillet radius is denoted by R [mm]; an angle of incidence of the X-rays is denoted by Ψ [°]; a distance between an end portion of a housing of the diffracted X-rays measurement device on the fillet portion side and the rotation center in the irradiation direction of the X-rays is denoted by h [mm]; a top-to-bottom width of an end portion of the housing on a side adjacent to the fillet portion is denoted by W [mm]: a complementary angle of the Bragg angle is denoted by η [°]; a top-to-bottom width of a detection region of a two-dimensional detector of the diffracted X-rays measurement device is denoted by D [mm]; and an interval between the flange portion and an imaginary straight line which passes through the fillet center and is parallel to the flange portion is denoted by a [mm], the control unit controls the movement and rotation such that inequality 1 and inequality 2 are satisfied:
(Lmin+h)sin(θ+ψ)−R sin θ≤X≤(Lmax+h)sin(θ+ψ)−R sin θ 1
(Lmin+h)cos(θ+ψ)−R cos θ≤Z≤(Lmax+h)cos(θ+ψ)−R cos θ 2
wherein with respect to an imaginary straight line which passes through a measurement site and the fillet center, the angle of incidence Ψ of the X-rays is defined to be positive in a case of tilting toward the axis portion, and is defined to be negative in a case of tilting toward the flange portion: in a case in which Ψ≥0, the irradiation distance L of the X-rays satisfies inequality 3; and in a case in which Ψ<0, the irradiation distance L of the X-rays satisfies inequality 4:
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