US 12,436,117 B2
Spin-resolved ultrafast electron diffraction
Byron Freelon, Houston, TX (US)
Assigned to University of Houston System, Houston, TX (US)
Filed by UNIVERSITY OF HOUSTON SYSTEM, Houston, TX (US)
Filed on Mar. 31, 2023, as Appl. No. 18/129,723.
Claims priority of provisional application 63/326,591, filed on Apr. 1, 2022.
Prior Publication US 2023/0314348 A1, Oct. 5, 2023
Int. Cl. G01N 23/20058 (2018.01); G01N 23/20008 (2018.01); G01N 23/205 (2018.01); G01N 23/2055 (2018.01); H01J 37/295 (2006.01)
CPC G01N 23/20058 (2013.01) [G01N 23/20008 (2013.01); G01N 23/205 (2013.01); G01N 23/2055 (2013.01); H01J 37/295 (2013.01); G01N 2223/413 (2013.01)] 18 Claims
OG exemplary drawing
 
1. An electron diffraction device comprising:
an electron source, wherein the electron source comprises a gas jet comprising photo-ionizable noble gas atoms that produce photoionized, spin-polarized electrons to form an electron probe pulse when a laser probe pulse impinges upon the electron source; and
an anode,
wherein the laser probe pulse interacts with electrons from the electron source to generate the electron probe pulse that passes through the anode and diffracts from a sample yielding a diffraction pattern; and
wherein data is configured to be collected at one instance using the diffraction pattern to yield a first snapshot of diffractive information.