US 12,436,066 B2
Systems and methods of parallel testing of medical devices
Karl A. Ruiter, Honolulu, HI (US); Gregory Randolph Alkire, Keene, CA (US); Julio Roberto Castro, Santa Clarita, CA (US); and Robert Edward Whitten, Tujunga, CA (US)
Assigned to PRONK TECHNOLOGIES, INC., Sun Valley, CA (US)
Filed by PRONK TECHNOLOGIES, INC., Sun Valley, CA (US)
Filed on Sep. 8, 2023, as Appl. No. 18/243,836.
Application 18/243,836 is a continuation of application No. 17/032,887, filed on Sep. 25, 2020, granted, now 11,781,946.
Claims priority of provisional application 62/907,515, filed on Sep. 27, 2019.
Prior Publication US 2023/0417633 A1, Dec. 28, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G16H 15/00 (2018.01); G01M 99/00 (2011.01); G16H 40/40 (2018.01)
CPC G01M 99/005 (2013.01) [G16H 15/00 (2018.01); G16H 40/40 (2018.01)] 19 Claims
OG exemplary drawing
 
1. A system for testing medical devices comprising:
a computing device in communication with a test device configured for testing a medical device, wherein the computing device comprises a processor having addressable memory, wherein the processor is configured to:
initiate testing of the medical device by the test device;
receive one or more parameter values from the test device based on test information results; and
generate an alert notification if the received one or more parameter values are entered faster than a predetermined limit thereby avoiding user error.