US 12,436,041 B2
Semiconductor device and physical quantity sensor device
Hiroyuki Nakajima, Matsumoto (JP)
Assigned to FUJI ELECTRIC CO., LTD., Kawasaki (JP)
Filed by FUJI ELECTRIC CO., LTD., Kawasaki (JP)
Filed on Nov. 25, 2022, as Appl. No. 17/994,063.
Claims priority of application No. 2022-007967 (JP), filed on Jan. 21, 2022; and application No. 2022-085476 (JP), filed on May 25, 2022.
Prior Publication US 2023/0236071 A1, Jul. 27, 2023
Int. Cl. G01K 7/24 (2006.01); G01K 13/00 (2021.01); H03M 1/06 (2006.01); H03M 1/12 (2006.01)
CPC G01K 7/24 (2013.01) [G01K 13/00 (2013.01); G01K 2219/00 (2013.01); H03M 1/06 (2013.01); H03M 1/12 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A semiconductor device, comprising:
a thermistor for temperature detection;
a series resistor selection circuit including a series resistor group that is connected in series with the thermistor, the series resistor selection circuit being configured to select a series resistor from the series resistor group according to a selection signal;
an analog/digital (A/D) converter that performs A/D conversion on a divided voltage obtained by dividing an internal power supply voltage between the thermistor and the selected series resistor to generate divided voltage data, and outputs the divided voltage data; and
a control circuit that
during a period of selecting the series resistor, controls the A/D converter to operate in a low bit count mode, such that the selected series resistor causes the divided voltage data to fall within a predetermined voltage range, and
controls the A/D converter to operate in a high bit count mode after selecting the series resistor.