| CPC G01B 11/303 (2013.01) | 9 Claims |

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1. A multilayer film measuring device, comprising:
a measuring module, having a projection port and a receiving port on one side thereof, the measuring module further including a light source unit, the light source unit being located corresponding to the projection port for generating a laser beam;
a multilayer film to be measured, having a first waveplate and a reflective polarizer, wherein the first waveplate is closer to the measuring module than the reflective polarizer;
a circular polarization module, located between the measuring module and the multilayer film to be measured, the circular polarization module having a second waveplate and a second linear polarizer, wherein the second linear polarizer is closer to the measuring module than the second waveplate;
wherein when the light source unit projects the laser beam from the projection port, the laser beam passes through the circular polarization module to the multilayer film to be measured, the reflective polarizer completely reflects the laser beam through the circular polarization module to the receiving port, and the laser beam shifted by a surface of the first waveplate is absorbed by the second linear polarizer.
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