US 12,435,241 B2
Systems and methods for improved material sample analysis and quality control
Brandon Lee Goodchild Drake, Greeley, CO (US); and Ry Nathaniel Zawadzki, Belmont (AU)
Assigned to DECISION TREE, LLC, Greeley, CO (US); and VERACIO, LTD., Salt Lake City, UT (US)
Appl. No. 18/036,096
Filed by LONGYEAR TM, INC., Salt Lake City, UT (US); and DECISION TREE, LLC, Greeley, CO (US)
PCT Filed Nov. 11, 2021, PCT No. PCT/US2021/058966
§ 371(c)(1), (2) Date May 9, 2023,
PCT Pub. No. WO2022/103952, PCT Pub. Date May 19, 2022.
Claims priority of provisional application 63/112,518, filed on Nov. 11, 2020.
Prior Publication US 2025/0271369 A1, Aug. 28, 2025
Int. Cl. G01N 23/223 (2006.01); G01N 33/24 (2006.01)
CPC G01N 23/223 (2013.01) [G01N 33/24 (2013.01); G01N 2223/076 (2013.01); G01N 2223/616 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method comprising:
receiving, at a computing device, sample data associated with a plurality of material samples, wherein the sample data comprises x-ray fluorescence (XRF) spectra associated with the plurality of material samples, wherein each XRF spectrum is indicative of one or more properties present within a sample of the plurality of material samples;
determining, based on a plurality of reference values and a plurality of analysis thresholds:
a first subset of the plurality of material samples associated with acceptable XRF spectra; and
a second subset of the plurality of material samples associated with unacceptable XRF spectra;
and
providing, at a user interface, an indication of the first subset and the second subset.