US 12,433,515 B2
Dry electrochemical impedance spectroscopy metrology for conductive chemical layers
Chi-En Lin, Encino, CA (US); Akhil Srinivasan, Woodland Hills, CA (US); David L. Probst, Chandler, AZ (US); Melissa Tsang, Los Angeles, CA (US); Mohsen Askarinya, Chandler, AZ (US); Riley Clayton Kimball, Tempe, AZ (US); Robert McKinlay, West Hills, CA (US); Vu Nguyen, Chandler, AZ (US); Wally Dong, Chandler, AZ (US); Xin Heng, Glendale, CA (US); and Brennan Toshner, Northridge, CA (US)
Assigned to MEDTRONIC MINIMED, INC., Northridge, CA (US)
Filed by Medtronic MiniMed, Inc., Northridge, CA (US)
Filed on Aug. 13, 2021, as Appl. No. 17/401,716.
Prior Publication US 2023/0053254 A1, Feb. 16, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. A61B 5/1468 (2006.01); A61B 5/145 (2006.01); G01N 27/02 (2006.01); G01N 27/26 (2006.01); G01N 27/327 (2006.01); G01N 27/333 (2006.01)
CPC A61B 5/1468 (2013.01) [A61B 5/14532 (2013.01); G01N 27/026 (2013.01); G01N 27/26 (2013.01); G01N 27/3272 (2013.01); G01N 27/3274 (2013.01); G01N 27/333 (2013.01); A61B 2562/0271 (2013.01); A61B 2562/168 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method of testing one or more analyte sensors each comprising a first electrode; a second electrode; and a material layer disposed on or above the first electrode; the method comprising:
(a) applying a voltage potential to the first electrode with respect to the second electrode;
(b) measuring a test signal comprising an output current from the first electrode that results from the application of the voltage potential;
(c) using the test signal from (b) to determine a capacitance of the one or more analyte sensors, wherein the steps (a)-(c) are performed in an environment outside a human body without exposure of the first electrode and the second electrode to a fluid containing glucose;
(d) correlating the capacitance with a measurement of isig, wherein isig is a current associated with an electrochemical response of the one or more analyte sensors to the fluid containing the glucose, wherein the correlating comprises obtaining a plot of the isig versus the capacitance for a plurality of the one or more analyte sensors having different thicknesses of the material layer; and
(e) using the correlating to estimate a thickness of the material layer of the one or more analyte sensors during manufacturing for quality control purposes.