US 12,433,483 B2
Vision screening systems and methods
Yaolong Lou, Singapore (SG); Yuan Ing Chow, Singapore (SG); and Shadakshari Devarajaiah Chikkanaravangala, Singapore (SG)
Assigned to Welch Allyn, Inc., Skaneateles Falls, NY (US)
Filed by Welch Allyn, Inc., Skaneateles Falls, NY (US)
Filed on Jun. 10, 2021, as Appl. No. 17/344,838.
Claims priority of provisional application 63/041,550, filed on Jun. 19, 2020.
Prior Publication US 2021/0393120 A1, Dec. 23, 2021
Int. Cl. A61B 3/103 (2006.01); A61B 3/00 (2006.01); A61B 3/14 (2006.01); G16H 30/40 (2018.01)
CPC A61B 3/103 (2013.01) [A61B 3/0025 (2013.01); A61B 3/14 (2013.01); G16H 30/40 (2018.01)] 19 Claims
OG exemplary drawing
 
1. A system, comprising:
memory;
one or more processors; and
computer-executable instructions stored in the memory and executable by the one or more processors to perform operations comprising:
causing an eccentric radiation source to generate one or more beams of near infrared (NIR) radiation that are directed onto a retina of a patient;
causing a radiation sensor to collect information indicative of reflected NIR radiation from the retina, and to generate an analysis image based at least in part on the information;
identifying, based at least in part on the analysis image, a pupil of the patient;
determining a focus state of the analysis image;
determining that the focus state of the analysis image satisfies a set of image state thresholds;
based at least in part on determining that the focus state of the analysis image satisfies the set of image state thresholds, causing an image capture device to capture a plurality of images of the pupil;
identifying a subset of the plurality of images that satisfy the set of image state thresholds;
determining, based at least in part on the subset of the plurality of images,
a plurality of pupil positions, and
one or more radiation intensity profiles associated with the reflected NIR radiation detected by the radiation sensor; and
determining a refractive error of the patient based at least in part on the plurality of pupil positions and the one or more radiation intensity profiles.