| CPC A45D 29/00 (2013.01) [G06T 7/149 (2017.01); A45D 2029/005 (2013.01)] | 11 Claims |

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1. A contour detection apparatus comprising at least one processor that
detects a first nail contour defining a nail region from a finger image of a finger including a nail by performing fitting with a nail contour model,
obtains a second nail contour input from a user against the first nail contour that the user does not approve, and
classifies the first nail contour as a group based on dimensional information on dimensions of the first nail contour, and derives difference information indicating a difference between the first nail contour and the second nail contour,
wherein the processor performs a correction process with the difference information on another first nail contour that is newly detected and not approved by the user, and the difference information includes: information indicating, among feature points constituting the first nail contour against which the second nail contour is input, a maximum error feature point having a largest difference from the second nail contour; and information indicating a magnitude of the difference.
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