CPC H01L 29/78696 (2013.01) [H01L 21/0259 (2013.01); H01L 21/823807 (2013.01); H01L 21/823814 (2013.01); H01L 21/823864 (2013.01); H01L 21/823871 (2013.01); H01L 27/092 (2013.01); H01L 29/0665 (2013.01); H01L 29/41733 (2013.01); H01L 29/42392 (2013.01); H01L 29/66545 (2013.01); H01L 29/66553 (2013.01); H01L 29/66742 (2013.01); H01L 29/78618 (2013.01)] | 20 Claims |
1. A method of manufacturing a semiconductor device, the method comprising:
forming a first active region on a substrate;
forming a division region extending in a first direction, the division region dividing the first active region into first and second active patterns, wherein the first and second active patterns are spaced apart in a second direction, and the second direction is perpendicular to the first direction; and
forming a first channel pattern on the first active pattern and a second channel pattern on the second active pattern,
wherein an end portion of the first active pattern adjacent to the division region comprises a protruding portion extending in the first direction, and
the protruding portion has a triangle shape, when viewed in a plan view.
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