US 12,105,963 B2
NAND string read voltage adjustment
Yi Song, San Jose, CA (US); Jiahui Yuan, Fremont, CA (US); and Yanjie Wang, Santa Clara, CA (US)
Assigned to SanDisk Technologies LLC, Addison, TX (US)
Filed by SanDisk Technologies LLC, Addison, TX (US)
Filed on Sep. 8, 2022, as Appl. No. 17/940,465.
Prior Publication US 2024/0086074 A1, Mar. 14, 2024
Int. Cl. G06F 3/06 (2006.01)
CPC G06F 3/0619 (2013.01) [G06F 3/0653 (2013.01); G06F 3/0679 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus, comprising:
a control circuit configured to connect to NAND strings that are connected to bit lines, each bit line connected to a plurality of NAND strings in a corresponding plurality of regions of a block, the control circuit configured to:
apply a read voltage in read operations directed to NAND strings of the plurality of regions of the block, subsequently, in response to a write erase cycle count of the block reaching a predetermined number of cycles, adjust the read voltage by a first predetermined amount for read operations directed to NAND strings of a first region of the block and adjust the read voltage by a second predetermined amount for read operations directed to NAND strings of a second region of the block, the first and second predetermined amounts based on respective locations of the first and second regions in the block.