US 12,105,858 B2
Systems and methods for laser probing for hardware trojan detection
Mark M. Tehranipoor, Gainesville, FL (US); Andrew Stern, Gainesville, FL (US); Shahin Tajik, Gainesville, FL (US); and Farimah Farahmandi, Gainesville, FL (US)
Assigned to University of Florida Research Foundation, Incorporated, Gainesville, FL (US)
Filed by University of Florida Research Foundation, Incorporated, Gainesville, FL (US)
Filed on Mar. 9, 2021, as Appl. No. 17/196,035.
Claims priority of provisional application 62/987,898, filed on Mar. 11, 2020.
Prior Publication US 2021/0286905 A1, Sep. 16, 2021
Int. Cl. G06F 21/78 (2013.01); G01R 31/311 (2006.01); G06F 1/10 (2006.01); G06F 1/28 (2006.01); G06F 21/55 (2013.01)
CPC G06F 21/78 (2013.01) [G01R 31/311 (2013.01); G06F 1/10 (2013.01); G06F 1/28 (2013.01); G06F 21/55 (2013.01); G06F 2221/034 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A method comprising:
generating a first electro-optical frequency map (EOFM) of an active layer of an integrated circuit (IC) by:
powering on the IC;
applying a first clock signal to the IC at a first frequency such that the first clock signal propagates through sequential elements of the IC; and
identifying the sequential elements within the IC;
generating a second EOFM of the active layer of the IC by:
placing the IC into a scan mode;
applying the first clock signal and a test pattern comprising scan inputs the IC such that a second frequency that is different from the first frequency is derived; and
identifying all sequential elements connected to a scan chain of the IC;
comparing the first EOFM of the IC with the second EOFM of the IC to determine whether there is a match between an intensity of an identified region in the first EOFM and an intensity of a corresponding region of the second EOFM of the IC; and
responsive to determining there is no match, detecting one or more hardware Trojans in the IC.