US 12,105,332 B2
Wavelength checker
Takuya Tanaka, Tokyo (JP); and Kota Shikama, Tokyo (JP)
Assigned to Nippon Telegraph and Telephone Corporation, Tokyo (JP)
Appl. No. 17/776,890
Filed by Nippon Telegraph and Telephone Corporation, Tokyo (JP)
PCT Filed Nov. 15, 2019, PCT No. PCT/JP2019/044866
§ 371(c)(1), (2) Date May 13, 2022,
PCT Pub. No. WO2021/095231, PCT Pub. Date May 20, 2021.
Prior Publication US 2022/0404565 A1, Dec. 22, 2022
Int. Cl. G02B 6/42 (2006.01)
CPC G02B 6/4214 (2013.01) 20 Claims
OG exemplary drawing
 
1. A wavelength checker comprising:
an optical waveguide chip mounted on a main substrate and connected to an optical fiber, the optical waveguide chip comprising an arrayed waveguide diffraction grating;
a reflection portion fixed to a position on the main substrate at which the reflection portion faces a light emission end surface of the optical waveguide chip on a side from which light is output to an external space, the reflection portion comprising a reflection surface that faces the light emission end surface and is inclined with respect to a plane of the main substrate such that a reflection direction is toward an upper side of the main substrate; and
a light conversion portion comprising a conversion material configured to convert near infrared light to visible light, wherein the light conversion portion is arranged adjacent to the light emission end surface of the optical waveguide chip.