US 12,105,271 B2
Microscope and method for microscopic image recording with variable illumination
Tiemo Anhut, Jena (DE); Daniel Schwedt, Jena (DE); and Yauheni Novikau, Jen (DE)
Assigned to Carl Zeiss Microscopy GmbH, Jena (DE)
Filed by Carl Zeiss Microscopy GmbH, Jena (DE)
Filed on Jul. 19, 2021, as Appl. No. 17/378,991.
Claims priority of application No. 10 2020 209 889 (DE), filed on Aug. 5, 2020.
Prior Publication US 2022/0043246 A1, Feb. 10, 2022
Int. Cl. G02B 21/00 (2006.01)
CPC G02B 21/0052 (2013.01) [G02B 21/0032 (2013.01); G02B 21/0036 (2013.01)] 17 Claims
OG exemplary drawing
 
1. Microscope for recording microscopic images, having an excitation beam path for guiding excitation light, comprising
a laser light source for providing a laser light beam as excitation light;
a scanning apparatus for setting an angle of incidence of a focused laser light beam into a laser focus in the entrance pupil of an illumination objective; wherein the laser focus is directed into an entrance point that is offset radially with respect to the optical axis of the illumination objective;
a detection beam path for guiding detection light, including
a microlens array having a focal plane into which a plurality of partial imaged presentations are imaged owing to the effect of the microlens array; and
a spatially resolved detector (camera), arranged in the focal plane of the microlens array, for capturing the partial imaged presentations as image signals,
and an evaluation unit, which is configured for evaluating the captured image signals of the detector according to light-field-technology on the basis of spatial information and angle information of the light beams that are captured per detection element of the detector,
wherein
a controllable means for setting the phase distribution of the laser light beam and of an intensity distribution resulting therefrom is arranged in the entrance pupil in the excitation beam path between the laser light source and the scanning apparatus; and
a respective entrance point of the laser light beam is selected or can be selected by means of the controllable means for setting the phase distribution on the basis of the respectively set phase distribution.