| CPC G01R 31/31724 (2013.01) [G01R 31/31706 (2013.01); H03M 1/742 (2013.01); H03M 1/785 (2013.01)] | 35 Claims |
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1. A device, comprising:
a digital-to-analog converter (DAC) having a switching network including a plurality of switches, wherein the DAC, in operation, generates analog output signals in response to input codes of a set of input codes of the DAC; and built-in-self-test (BIST) circuitry coupled to the DAC, wherein the BIST circuitry, in a self-test mode of operation:
sequentially applies codes of a determined subset of codes of the set of input codes to test the plurality of switches, the determined subset of codes having fewer codes than the set of input codes;
detects failures of switches of the plurality of switches based on responses of the DAC to the applied codes; and
in response to detecting a failure of a switch of the plurality of switches, generates a signal indicating a failure of the switching network, wherein the BIST circuitry, in the self-test mode of operation;
performs an open-failure test of the plurality of switches;
generates an indication of a failure of the open-failure test based on a result of the open-failure test;
selectively performs a closed-failure test of the plurality of switches based on the result of the open-failure test; and
generates an indication of a failure of the closed-failure test based on a result of the closed-failure test.
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