	US 12,105,138 B2
	Test socket
Young taek Shin, Busan (KR); and Byeong cheol Lee, Busan (KR)
Assigned to LEENO INDUSTRIAL INC., Busan (KR)
Appl. No. 17/928,867
Filed by LEENO INDUSTRIAL INC., Busan (KR)
PCT Filed May 28, 2021, PCT No. PCT/KR2021/006641 § 371(c)(1), (2) Date Nov. 30, 2022, PCT Pub. No. WO2021/246719, PCT Pub. Date Dec. 9, 2021.
Claims priority of application No. 10-2020-0065853 (KR), filed on Jun. 1, 2020.
Prior Publication US 2023/0228808 A1, Jul. 20, 2023
Int. Cl. G01R 31/28 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01)

CPC G01R 31/2863 (2013.01) [G01R 1/0466 (2013.01); G01R 1/06733 (2013.01); G01R 1/07314 (2013.01)]

9 Claims

1. A test socket comprising: a first block comprising a first base member of a conductive material and a first insulating member of an insulating material; a second block comprising a second base member of a conductive material and a second insulating member of an insulating material; a gap member of an insulating material, interposed between the first block and the second block; a first probe supported being in contact with the first base member and being not in contact with the second base member; a second probe supported being not in contact with the first base member and being in contact with the second base member; and electronic parts provided in the gap member and placed on a conductive path by which the first base member and the second base member are electrically connected.