coupling the structure-under-test to a plurality of exciter devices and a plurality of response sensors;

generating an excitation signal;

automatically applying the excitation signal iteratively to each exciter device of the plurality of exciter devices, wherein applying the excitation signal to an exciter device causes the exciter device to impart an excitation force to the structure-under-test;

collecting sensor data from each response sensor of the plurality of response sensors while iteratively applying the excitation signal to the plurality of exciter devices, wherein the collected sensor data includes response data for each of a plurality of different exciter-sensor combinations, wherein the response data for each of the plurality of different exciter-sensor combinations includes the sensor data collected by a single response sensor while the excitation force is imparted to the structure-under-test by a single exciter device;

applying a signal quality test to the collected sensor data to determine whether the collected response data for a first exciter-sensor combination of the plurality of different exciter-sensor combinations does not satisfy a defined signal quality condition; and

repeating a data collection for the first exciter-sensor combination in response to determining that the collected response data for the first exciter-sensor combination does not satisfy the defined signal quality condition, wherein repeating the data collection for the first exciter-sensor combination includes applying the excitation signal to a first exciter device of the first exciter-sensor combination and collecting updated sensor data from a first response sensor of the first exciter-sensor combination while the excitation signal is applied to the first exciter device.