US 12,104,948 B2
Optical measurement device with universal metasurface and optical measuring method using the same
Jonghwa Shin, Daejeon (KR); Taeyong Chang, Daejeon (KR); and Joonkyo Jung, Daejeon (KR)
Assigned to Korea Advanced Institute of Science and Technology, Daejeon (KR)
Filed by KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon (KR)
Filed on Aug. 10, 2023, as Appl. No. 18/232,506.
Application 18/232,506 is a continuation of application No. PCT/KR2022/002033, filed on Feb. 10, 2022.
Claims priority of application No. 10-2021-0018841 (KR), filed on Feb. 10, 2021; and application No. 10-2022-0017236 (KR), filed on Feb. 10, 2022.
Prior Publication US 2023/0384152 A1, Nov. 30, 2023
Int. Cl. G01J 1/04 (2006.01); G01J 4/00 (2006.01); G01J 9/02 (2006.01); G02B 21/00 (2006.01)
CPC G01J 1/0407 (2013.01) [G01J 4/00 (2013.01); G01J 9/02 (2013.01); G02B 21/0092 (2013.01)] 17 Claims
OG exemplary drawing
 
1. An optical measurement device, comprising:
a universal metasurface on which light is incident;
a polarization sensor configured to measure a polarization state of light passing through the universal metasurface; and
a controller configured to collect a quantitative differential interference contrast (QDIC) image for the x polarization of incident light that is collected by the polarization sensor, a QDIC image for y polarization, and a quantitative relative phase (QRP) image representing a relative phase difference between the x polarization and y polarization and configured to calculate intensity, a phase or polarization information of the incident light.