US 11,774,526 B2
Magnetometry based on electron spin defects
Stefan Bogdanovic, Mountain View, CA (US); and Stefan Leichenauer, Mountain View, CA (US)
Assigned to X Development LLC, Mountain View, CA (US)
Filed by X Development LLC, Mountain View, CA (US)
Filed on Sep. 10, 2021, as Appl. No. 17/472,209.
Claims priority of provisional application 63/076,750, filed on Sep. 10, 2020.
Prior Publication US 2022/0075013 A1, Mar. 10, 2022
Int. Cl. G01R 33/32 (2006.01); G01N 24/10 (2006.01); G01R 33/26 (2006.01)
CPC G01R 33/323 (2013.01) [G01N 24/10 (2013.01); G01R 33/26 (2013.01)] 40 Claims
OG exemplary drawing
 
1. A magnetometer comprising:
a sample signal device;
a reference signal device;
a microwave field generator arranged to apply a microwave field to the sample signal device and the reference signal device;
an optical source configured to emit light comprising light of a first wavelength that interacts optically with the sample signal device and with the reference signal device, wherein a first optical path of the light from the optical source to the sample signal device has a common portion with a second optical path of the light from the optical source to the reference signal device;
at least one photodetector arranged to detect a sample photoluminescence signal comprising light of a second wavelength emitted from the sample signal device and a reference photoluminescence signal comprising light of the second wavelength emitted from the reference signal device, wherein the first wavelength is different from the second wavelength; and
a magnet arranged adjacent to the sample signal device and the reference signal device.