US 11,772,964 B2
Method of controlling the placement of micro-objects on a micro-assembler
Anne Plochowietz, Palo Alto, CA (US); Bradley Rupp, San Francisco, CA (US); Jengping Lu, Fremont, CA (US); Julie A. Bert, East Palo Alto, CA (US); Lara S. Crawford, Los Altos, CA (US); Sourobh Raychaudhuri, Mountain View, CA (US); Eugene M. Chow, Palo Alto, CA (US); Matthew Shreve, Mountain View, CA (US); and Sergey Butylkov, Oakland, CA (US)
Assigned to Xerox Corporation, Norwalk, CT (US)
Filed by Palo Alto Research Center Incorporated, Palo Alto, CA (US)
Filed on Feb. 4, 2022, as Appl. No. 17/665,305.
Application 17/665,305 is a division of application No. 16/237,419, filed on Dec. 31, 2018, granted, now 11,242,244.
Prior Publication US 2022/0153576 A1, May 19, 2022
Int. Cl. B81C 99/00 (2010.01); H01L 21/67 (2006.01); H01L 23/00 (2006.01)
CPC B81C 99/002 (2013.01) [H01L 21/67271 (2013.01); H01L 21/67294 (2013.01); H01L 24/95 (2013.01); H01L 2224/95133 (2013.01); H01L 2224/95145 (2013.01); H01L 2924/1461 (2013.01); Y10T 29/49131 (2015.01); Y10T 29/5313 (2015.01)] 9 Claims
OG exemplary drawing
 
1. A method, comprising:
detecting a current state of a set of micro-objects located on a surface of a micro-assembler comprising a plurality of force generating pixels;
determining a next mode for a control component based on the current state of the set of micro-objects, wherein the control component is in a current mode;
identifying a set of control patterns based on the next mode; and
manipulate the set of micro-objects using the set of control patterns, wherein each control pattern of the set of control patterns indicates a voltage pattern on a portion of the plurality of force generating pixels;
wherein a second set of control patterns is used to manipulate the set of micro-objects when the control component is in the current mode.