| CPC H01J 37/222 (2013.01) [H01J 37/1474 (2013.01); H01J 37/244 (2013.01); H01J 37/265 (2013.01); H01J 37/28 (2013.01); H01J 2237/1536 (2013.01); H01J 2237/226 (2013.01); H01J 2237/2448 (2013.01); H01J 2237/2803 (2013.01)] | 22 Claims |

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1. A method of operating a multi-beam charged particle microscope, the method comprising:
selecting a scan program from a plurality of scan programs;
generating, from the selected scan program: i) a first sequence of pre-compensation digital scan commands to pre-compensate a scanning induced distortion of the multi-beam charged particle microscope; and ii) a selection control signal;
generating, from the first sequence of pre-compensation digital scan commands, a first amplified sequence of drive voltages;
using the first amplified sequence of drive voltages to collectively deflect a plurality of primary charged particle beamlets generated by the multi-beam charged particle microscope over a plurality of image subfields of the multi-beam charged particle microscope on a surface of a sample in the multi-beam charged particle microscope;
collecting streams of fluctuating voltages from an image sensor unit of the multi-beam charged particle microscope;
converting the streams of fluctuating voltages;
using the selection control signal to control selection of the converted streams of fluctuating voltage to provide streams of digital image data values; and
using the selection control signal to control writing the streams of digital image data values into a parallel access memory at a plurality of memory locations to provide a plurality of digital image data corresponding to the plurality of image subfields.
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