US 12,431,215 B2
Dynamic read calibration
Li-Te Chang, San Jose, CA (US); Aaron Lee, Sunnyvale, CA (US); Zhenming Zhou, San Jose, CA (US); and Murong Lang, San Jose, CA (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Nov. 27, 2023, as Appl. No. 18/519,248.
Claims priority of provisional application 63/428,548, filed on Nov. 29, 2022.
Prior Publication US 2024/0177795 A1, May 30, 2024
Int. Cl. G11C 16/04 (2006.01); G11C 16/08 (2006.01); G11C 16/28 (2006.01); G11C 16/34 (2006.01); G11C 29/52 (2006.01)
CPC G11C 29/52 (2013.01) [G11C 16/08 (2013.01); G11C 16/28 (2013.01); G11C 16/3404 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system comprising:
a memory device comprising a plurality of memory cells; and
a processing device, operatively coupled with the memory device, to perform operations comprising:
identifying, among a plurality of wordlines on the memory device, a group of wordlines, wherein each wordline of the group of wordlines is connected to a respective subset of memory cells;
assigning, to the group of wordlines, a specified charge loss classification value characterizing a shift of a threshold voltage distribution;
selecting a page level of a page level hierarchy, wherein the page level comprises a set of memory cell charge states;
selecting a first set of memory cells comprising one or more memory cells having their respective charge states corresponding to the page level;
determining, for the first set of memory cells, an aggregate value of a first data state metric;
responsive to determining that the aggregate value of the first data state metric satisfies a first criterion, identifying, among the first set of memory cells, a second set of memory cells charged to a specified charge state within the page level;
determining, for the second set of memory cells, an aggregate value of a second data state metric based on one or more distributions of individual values of the second data state metric;
maintaining a skew counter of skewed distributions of the second data state metric;
identifying a read reference voltage offset associated with the specified charge state;
updating the read reference voltage offset based on the value of the skew counter; and
applying the updated read reference voltage offset in a read operation performed on the memory cells connected to the group of wordlines.