US 12,431,047 B2
Display device and inspection method thereof
Ki Nyeng Kang, Yongin-si (KR); Min Joo Kim, Yongin-si (KR); Tae Hoon Yang, Yongin-si (KR); Sang Hoon Lee, Yongin-si (KR); and Seon Beom Ji, Yongin-si (KR)
Assigned to Samsung Display Co., Ltd., Yongin-si (KR)
Filed by SAMSUNG DISPLAY CO., LTD., Yongin-si (KR)
Filed on Apr. 24, 2023, as Appl. No. 18/306,206.
Application 18/306,206 is a continuation of application No. 17/116,206, filed on Dec. 9, 2020, granted, now 11,636,788.
Claims priority of application No. 10-2020-0032003 (KR), filed on Mar. 16, 2020.
Prior Publication US 2023/0267862 A1, Aug. 24, 2023
Int. Cl. G09G 3/00 (2006.01); G09G 3/32 (2016.01)
CPC G09G 3/006 (2013.01) [G09G 3/32 (2013.01); G09G 2310/0278 (2013.01)] 8 Claims
OG exemplary drawing
 
1. An inspection method of a display device, the inspection method comprising:
checking connection failures of light emitting elements included in a pixel and connected in series based on a first control signal, a second control signal, and a voltage of an initialization power source,
wherein the pixel comprises:
a pixel circuit controlling a current flowing from a first power source to a second node in response to a voltage of a first node;
a first light emitting element connected to the second node;
a first transistor having a first electrode connected to the second node, a second electrode connected to a sensing line supplying the voltage of the initialization power source, and a gate electrode connected to a control line;
a second light emitting element electrically connected between the first light emitting element and a second power source; and
a second transistor having a first electrode connected to a third node between the first light emitting element and the second light emitting element, a second electrode of the second transistor connected to the second power source, and a gate electrode connected to a first inspection control line, and
wherein the checking the connection failures of the light emitting elements includes:
supplying the initialization power source of a first voltage level to the sensing line, and turning on the first transistor and the second transistor;
determining that a connection of the second light emitting element is abnormal during light emission by the pixel; and
determining that a connection of the first light emitting element is abnormal during a period that the pixel does not emit light.