US 12,430,404 B2
Method and apparatus for processing synthetic features, model training method, and electronic device
Kafeng Wang, Beijing (CN); Chengzhong Xu, Beijing (CN); Haoyi Xiong, Beijing (CN); Xingjian Li, Beijing (CN); and Dejing Dou, Beijing (CN)
Assigned to BEIJING BAIDU NETCOM SCIENCE TECHNOLOGY CO., LTD., Beijing (CN)
Filed by BEIJING BAIDU NETCOM SCIENCE TECHNOLOGY CO., LTD., Beijing (CN)
Filed on Nov. 16, 2022, as Appl. No. 17/988,168.
Claims priority of application No. 202111372268.4 (CN), filed on Nov. 18, 2021.
Prior Publication US 2023/0072240 A1, Mar. 9, 2023
Int. Cl. G06F 18/21 (2023.01); G06F 18/213 (2023.01); G06F 18/2415 (2023.01)
CPC G06F 18/2193 (2023.01) [G06F 18/213 (2023.01); G06F 18/2415 (2023.01)] 13 Claims
OG exemplary drawing
 
1. A method for processing synthetic features, comprising:
obtaining the synthetic features to be evaluated and original features corresponding to the synthetic features;
performing a feature extraction on the synthetic features to be evaluated based on a number S of pre-trained samples, to obtain meta features with S samples, wherein S is a positive integer;
inputting the meta features into a pre-trained meta feature evaluation model for a binary classification prediction, to obtain a probability of binary classification;
performing quality screening on the synthetic features to be evaluated according to the probability of the binary classification, to obtain a second synthetic features to be evaluated, wherein the second synthetic features are classified in a good category; and
inputting the second synthetic features and the original features into a first classifier for evaluation.