US 12,430,038 B1
Automated power limit write pacing to control NAND endurance
Earl Medeiros, Fall River, MA (US); Ramesh Doddaiah, Westborough, MA (US); and Adnan Sahin, Needham, MA (US)
Assigned to Dell Products L.P., Round Rock, TX (US)
Filed by Dell Products L.P., Round Rock, TX (US)
Filed on Mar. 28, 2024, as Appl. No. 18/619,541.
Int. Cl. G06F 3/06 (2006.01)
CPC G06F 3/0616 (2013.01) [G06F 3/0634 (2013.01); G06F 3/0679 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method, comprising:
obtaining a current wear metric value that is associated with at least one storage device;
obtaining an expected wear metric value that corresponds to the current wear metric value;
comparing the current wear metric value to the expected wear metric value; and
decreasing a maximum power consumption limit of the storage device from a current level to a first level that is lower than the current level, the maximum power consumption limit of the storage device being decreased in response to detecting that the current wear metric value exceeds the expected wear metric value by a first predetermined amount.