US 12,424,626 B2
Composite material, and method for manufacturing same
Norihiko Miyashita, Ageo (JP)
Assigned to MITSUI MINING & SMELTING CO., LTD., (JP)
Appl. No. 18/291,464
Filed by Mitsui Mining & Smelting Co., Ltd., Tokyo (JP)
PCT Filed Feb. 22, 2023, PCT No. PCT/JP2023/006584
§ 371(c)(1), (2) Date Jan. 23, 2024,
PCT Pub. No. WO2023/163071, PCT Pub. Date Aug. 31, 2023.
Claims priority of application No. 2022-028735 (JP), filed on Feb. 26, 2022.
Prior Publication US 2025/0105285 A1, Mar. 27, 2025
Int. Cl. H01M 4/58 (2010.01)
CPC H01M 4/5815 (2013.01) [H01M 4/582 (2013.01)] 5 Claims
OG exemplary drawing
 
1. A method for producing a composite material, comprising:
a preparation step of preparing a compound A containing a lithium (Li) element, a sulfur(S) element and an M element and containing a crystal phase with an argyrodite-type crystal structure, wherein M comprises at least one selected from the group consisting of a phosphorus (P) element, a germanium (Ge) element, an antimony (Sb) element, a silicon (Si) element, a tin (Sn) element, an aluminum (Al) element, a titanium (Ti) element, an iron (Fe) element, a nickel (Ni) element, a cobalt (Co) element, and a manganese (Mn) element; and
a mixing step of mixing the compound A and a conductive material to obtain a composite material in which the compound A and the conductive material are composited;
wherein the mixing step is performed in such a manner that an amorphous degree N obtained by Formula (1) below is 97% or more:

OG Complex Work Unit Math
wherein I0 represents an intensity of a peak A which is a diffraction peak observed at a position 2θ=29.7°±1.00° in an X-ray diffraction pattern obtained when the compound A is measured using an X-ray diffraction device using CuKα1 rays, and
It represents an intensity of a peak B which is a diffraction peak observed at a position 2θ=29.7°±1.00° in an X-ray diffraction pattern obtained when the composite material is measured using an X-ray diffraction device using CuKα1 rays.