US 12,424,251 B2
Storage system and method for circuit-bounded-array-based time and temperature tag management and inference of read thresholds
Alexander Bazarsky, Holon (IL); Ariel Navon, Revava (IL); Eran Sharon, Rishon Lezion (IL); David Avraham, San Jose, CA (US); Nika Yanuka, Hadera (IL); and Idan Alrod, Herzeliya (IL)
Assigned to Sandisk Technologies, Inc., Milpitas, CA (US)
Filed by Sandisk Technologies, Inc., Milpitas, CA (US)
Filed on Jul. 11, 2023, as Appl. No. 18/220,363.
Application 18/220,363 is a continuation in part of application No. 17/838,481, filed on Jun. 13, 2022, granted, now 12,283,328.
Application 18/220,363 is a continuation in part of application No. 17/899,073, filed on Aug. 30, 2022, granted, now 12,293,796.
Claims priority of provisional application 63/421,647, filed on Nov. 2, 2022.
Prior Publication US 2023/0402072 A1, Dec. 14, 2023
Int. Cl. G11C 11/00 (2006.01); G11C 7/10 (2006.01); G11C 11/54 (2006.01)
CPC G11C 7/1069 (2013.01) [G11C 7/1063 (2013.01); G11C 11/54 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A storage system comprising:
a memory comprising a plurality of memory dies, wherein each memory die comprises a respective circuit-bounded array; and
a processor coupled with the memory and configured to perform the following for each of the plurality of memory dies:
read a wordline in a memory die;
determine a read threshold based on the read wordline; and
send the read threshold to the circuit-bounded array in the memory die;
wherein each circuit-bounded array is configured to apply a machine-learning-based adjustment to the read threshold.