| CPC G06F 30/392 (2020.01) [G03F 1/36 (2013.01); G03F 1/70 (2013.01); G06F 30/39 (2020.01); G06F 30/398 (2020.01); H01L 21/28123 (2013.01); H10D 64/519 (2025.01); H10D 84/834 (2025.01); H10D 84/85 (2025.01); H10D 89/10 (2025.01); G03F 1/30 (2013.01); G03F 1/32 (2013.01); G03F 7/2002 (2013.01); G03F 7/2037 (2013.01); G06F 2111/20 (2020.01); G06F 2119/18 (2020.01); H01L 21/0274 (2013.01); H10B 10/12 (2023.02); H10D 84/0135 (2025.01); H10D 84/0158 (2025.01); H10D 84/0172 (2025.01); H10D 84/0193 (2025.01); H10D 84/038 (2025.01); H10D 84/853 (2025.01)] | 20 Claims |

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1. A semiconductor structure comprising:
first and second active regions extending in a first direction;
gate electrodes extending in a second direction perpendicular to the first direction, wherein each of the gate electrodes comprises:
a first segment over at least one of the first active region or the second active region;
a gate extension extending beyond each of the first active region and the second active region, wherein the gate extension has a uniform width in the first direction, and
a conductive element, wherein a width of the conductive element in the first direction increases as a distance from the gate extension increases along an entirety of the conductive element in the second direction.
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