US 12,422,390 B2
Device and method for a thermal analysis of a sample
Ekkehard Füglein, Selb (DE); and Georg Neumann, Schönwald (DE)
Assigned to NETZSCH-Gerätebau GmbH, Selb (DE)
Filed by NETZSCH-Gerätebau GmbH, Selb (DE)
Filed on Feb. 23, 2023, as Appl. No. 18/173,181.
Claims priority of application No. 102022104400.9 (DE), filed on Feb. 24, 2022.
Prior Publication US 2023/0266259 A1, Aug. 24, 2023
Int. Cl. G01N 25/48 (2006.01); B01L 3/04 (2006.01)
CPC G01N 25/48 (2013.01) [B01L 3/04 (2013.01); B01L 2300/044 (2013.01); B01L 2300/0672 (2013.01); B01L 2300/18 (2013.01)] 15 Claims
OG exemplary drawing
 
8. A method for a thermal analysis of a sample, which is located in the interior of a sample crucible having a crucible cover attached thereto, including the steps of:
introducing the sample crucible into a sample chamber through a chamber opening of a sample chamber,
attaching a chamber cover to the chamber opening of the sample chamber and creating a gas atmosphere in the sample chamber with a gas conveying mechanism,
piercing a hole into the crucible cover of the sample crucible with a piercing mechanism,
performing the thermal analysis of the sample with a temperature control mechanism for controlling the temperature of the sample chamber and a measuring mechanism for measuring a temperature of the sample and one or several further measured variables.